forked from D-Net/dnet-hadoop
[graph provision] avoid to parse again the XML records, apparently the escaped XML characters get unescaped invalidating the record
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46d2df1c90
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41e00bcd07
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@ -122,7 +122,8 @@ public class XmlRecordFactory implements Serializable {
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.buildBody(
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.buildBody(
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mainType, metadata, relations, listChildren(entity, je, templateFactory), listExtraInfo(entity));
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mainType, metadata, relations, listChildren(entity, je, templateFactory), listExtraInfo(entity));
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return printXML(templateFactory.buildRecord(entity, schemaLocation, body), indent);
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return templateFactory.buildRecord(entity, schemaLocation, body);
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// return printXML(templateFactory.buildRecord(entity, schemaLocation, body), indent);
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} catch (final Throwable e) {
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} catch (final Throwable e) {
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throw new RuntimeException(String.format("error building record '%s'", entity.getId()), e);
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throw new RuntimeException(String.format("error building record '%s'", entity.getId()), e);
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}
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}
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@ -47,13 +47,16 @@ public class XmlRecordFactoryTest {
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final String xml = xmlRecordFactory.build(new JoinedEntity<>(p));
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final String xml = xmlRecordFactory.build(new JoinedEntity<>(p));
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System.out.println(xml);
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assertNotNull(xml);
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assertNotNull(xml);
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final Document doc = new SAXReader().read(new StringReader(xml));
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final Document doc = new SAXReader().read(new StringReader(xml));
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doc.normalize();
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assertNotNull(doc);
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assertNotNull(doc);
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System.out.println(doc.asXML());
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//System.out.println(doc.asXML());
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assertEquals("0000-0001-9613-6638", doc.valueOf("//creator[@rank = '1']/@orcid"));
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assertEquals("0000-0001-9613-6638", doc.valueOf("//creator[@rank = '1']/@orcid"));
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assertEquals("0000-0001-9613-6639", doc.valueOf("//creator[@rank = '1']/@orcid_pending"));
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assertEquals("0000-0001-9613-6639", doc.valueOf("//creator[@rank = '1']/@orcid_pending"));
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@ -621,7 +621,7 @@
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"trust": ""
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"trust": ""
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},
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},
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"key": "10|CSC_________::a2b9ce8435390bcbfc05f3cae3948747",
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"key": "10|CSC_________::a2b9ce8435390bcbfc05f3cae3948747",
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"value": "VIRTA"
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"value": "Bulletin of the National Technical University \"KhPI\" A series of \"Information and Modeling\""
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},
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},
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"instancetype": {
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"instancetype": {
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"classid": "0001",
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"classid": "0001",
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@ -1488,7 +1488,7 @@
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"issnLinking": "",
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"issnLinking": "",
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"issnOnline": "",
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"issnOnline": "",
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"issnPrinted": "0018-9383",
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"issnPrinted": "0018-9383",
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"name": "IEEE Transactions on Electron Devices",
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"name": "IEEE Transactions on \"Electron Devices\"",
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"sp": "3884",
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"sp": "3884",
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"vol": "65"
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"vol": "65"
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},
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},
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@ -1557,7 +1557,7 @@
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"schemeid": "dnet:result_typologies",
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"schemeid": "dnet:result_typologies",
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"schemename": "dnet:result_typologies"
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"schemename": "dnet:result_typologies"
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},
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},
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"source": [],
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"source": [ { "value" : "Bulletin of the National Technical University \"KhPI\" A series of \"Information and Modeling\"; № 1 (3) (2020):" } ],
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"subject": [
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"subject": [
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{
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{
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"dataInfo": {
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"dataInfo": {
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