serialisation of APCs int he XML records
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parent
1f8302dc37
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600ede1798
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@ -348,9 +348,9 @@ public abstract class AbstractMdRecordToOafMapper {
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r.setContext(prepareContexts(doc, info));
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r.setContext(prepareContexts(doc, info));
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r.setExternalReference(new ArrayList<>()); // NOT PRESENT IN MDSTORES
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r.setExternalReference(new ArrayList<>()); // NOT PRESENT IN MDSTORES
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r
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r
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.setProcessingchargeamount(field(doc.valueOf("//oaf:processingchargeamount"), info));
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.setProcessingchargeamount(field(doc.valueOf("//oaf:processingchargeamount"), info));
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r
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r
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.setProcessingchargecurrency(field(doc.valueOf("//oaf:processingchargeamount/@currency"), info));
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.setProcessingchargecurrency(field(doc.valueOf("//oaf:processingchargeamount/@currency"), info));
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r.setInstance(instances);
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r.setInstance(instances);
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r.setBestaccessright(OafMapperUtils.createBestAccessRights(instances));
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r.setBestaccessright(OafMapperUtils.createBestAccessRights(instances));
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@ -398,6 +398,16 @@ public class XmlRecordFactory implements Serializable {
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if (r.getResourcetype() != null) {
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if (r.getResourcetype() != null) {
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metadata.add(XmlSerializationUtils.mapQualifier("resourcetype", r.getResourcetype()));
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metadata.add(XmlSerializationUtils.mapQualifier("resourcetype", r.getResourcetype()));
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}
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}
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if (r.getProcessingchargeamount() != null) {
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metadata
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.add(
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XmlSerializationUtils
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.asXmlElement("processingchargeamount", r.getProcessingchargeamount().getValue()));
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metadata
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.add(
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XmlSerializationUtils
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.asXmlElement("processingchargecurrency", r.getProcessingchargecurrency().getValue()));
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}
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}
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}
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switch (type) {
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switch (type) {
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@ -66,6 +66,9 @@ public class XmlRecordFactoryTest {
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assertEquals("10.5689/LIB.2018.2853550", doc.valueOf("//instance/alternateidentifier/text()"));
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assertEquals("10.5689/LIB.2018.2853550", doc.valueOf("//instance/alternateidentifier/text()"));
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assertEquals(3, doc.selectNodes("//instance").size());
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assertEquals(3, doc.selectNodes("//instance").size());
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assertEquals("1721.47", doc.valueOf("//processingchargeamount/text()"));
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assertEquals("EUR", doc.valueOf("//processingchargecurrency/text()"));
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}
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}
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@Test
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@Test
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@ -1655,5 +1655,37 @@
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},
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},
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"value": "Understanding Electromigration in Cu-CNT Composite Interconnects A Multiscale Electrothermal Simulation Study"
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"value": "Understanding Electromigration in Cu-CNT Composite Interconnects A Multiscale Electrothermal Simulation Study"
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}
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}
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]
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],
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"processingchargeamount": {
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"value": "1721.47",
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"dataInfo": {
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"invisible": true,
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"inferred": false,
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"deletedbyinference": false,
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"trust": "0.9",
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"inferenceprovenance": "",
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"provenanceaction": {
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"classid": "sysimport:crosswalk:datasetarchive",
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"classname": "sysimport:crosswalk:datasetarchive",
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"schemeid": "dnet:provenanceActions",
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"schemename": "dnet:provenanceActions"
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}
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}
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},
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"processingchargecurrency": {
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"value": "EUR",
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"dataInfo": {
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"invisible": true,
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"inferred": false,
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"deletedbyinference": false,
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"trust": "0.9",
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"inferenceprovenance": "",
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"provenanceaction": {
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"classid": "sysimport:crosswalk:datasetarchive",
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"classname": "sysimport:crosswalk:datasetarchive",
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"schemeid": "dnet:provenanceActions",
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"schemename": "dnet:provenanceActions"
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}
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}
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}
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}
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}
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