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@ -1655,5 +1655,37 @@
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},
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"value": "Understanding Electromigration in Cu-CNT Composite Interconnects A Multiscale Electrothermal Simulation Study"
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}
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]
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],
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"processingchargeamount": {
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"value": "1721.47",
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"dataInfo": {
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"invisible": true,
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"inferred": false,
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"deletedbyinference": false,
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"trust": "0.9",
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"inferenceprovenance": "",
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"provenanceaction": {
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"classid": "sysimport:crosswalk:datasetarchive",
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"classname": "sysimport:crosswalk:datasetarchive",
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"schemeid": "dnet:provenanceActions",
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"schemename": "dnet:provenanceActions"
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}
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}
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},
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"processingchargecurrency": {
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"value": "EUR",
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"dataInfo": {
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"invisible": true,
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"inferred": false,
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"deletedbyinference": false,
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"trust": "0.9",
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"inferenceprovenance": "",
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"provenanceaction": {
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"classid": "sysimport:crosswalk:datasetarchive",
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"classname": "sysimport:crosswalk:datasetarchive",
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"schemeid": "dnet:provenanceActions",
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"schemename": "dnet:provenanceActions"
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}
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}
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}
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}
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